Joe Merenda explains that APN originates from various sources including the physical properties of semiconductor devices, flicker noise, thermal noise, and external influences such as power supply fluctuations and imperfect grounding. Biasing circuits and amplifier topology also contribute significantly to the noise figure. He emphasizes the importance of understanding how these factors interact to degrade signal quality and how engineers can mitigate their impact during the design and testing process.

The webinar covers practical measurement techniques, including the use of spectrum analyzers and cross-correlation methods, which are essential for isolating the noise generated by the amplifier from other sources. Merenda discusses how operating conditions like input power level, frequency range, and temperature can affect APN, and why it is important to characterize devices under the same conditions in which they will operate in the field.

In terms of design strategy, the choice of amplifier technology—whether GaAs, InGaAs, or SiGe—plays a crucial role in determining phase noise performance. The webinar stresses the need for engineers to consider APN as a key parameter when selecting components for sensitive RF applications. Ultimately, understanding additive phase noise and its implications allows designers to optimize amplifier performance, ensuring higher signal integrity and more reliable system-level outcomes.

Mini-Circuits offers a wide selection of amplifiers with industry-leading APN performance. Our test lab at our Deer Park Technology center uses advanced measurement techniques to provide detailed, reliable data to help realize the best system performance for the user’s unique set of operating conditions.